Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Unitary Tests
High accuracy Schering bridge for the measurement of capacitance and dielectric dissipation factor (tan d) for the characterization of dielectric insulators, calibration of standards and manufacturing test of all industrial equipment.
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Portable PD Diagnostics System
PD-TaD 60
BAUR Prüf- und Messtechnik GmbH
The PD TaD 60 portable PD Diagnostics system is used in combination with a BAUR VLF generator frida for carrying out partial discharge measurement and location.* Comprehensive 360° cable analysis – with parallel partial discharge and dissipation factor measurement* Time-optimised and safe cable condition evaluation* The lightest and most compact PD measuring device up to 60 kVpeak* Developed for portable use on site
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Test Management Platform
Comprehensive suite of test management products fosters global project team collaboration, drives down costs, shortens release cycles, and provides real-time visibility into the status and quality of the software projects. Manage all aspects of software quality; integrate with JIRA and various test tools, all within the enterprise. Manage all aspects of software quality; add test management capabilities right inside JIRA.
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Interconnect Test Leads
142-1
This 64 inch pair of test leads connects with many different testing accessories and probes. Especially those found in typical test lead kits and assortments. The ends terminate in universal size 4mm banana plugs.
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Custom Automated Test Equipment
Peak Production has a team of highly qualified electrical and electronic design engineers that excel in the rapid development of Custom Automated Test Equipment (ATE), integrating test equipment from our multiple long term partners.
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AIT PXI Express Test & Simulation Instruments
Avionics Interface Technologies
AIT’s Test & Simulation Instruments for MIL-STD-1553, ARINC 429, ARINC 664/Avionics Ethernet, and Fibre Channel are available in PXI and PXI Express form factors and are supported by software drivers for Windows, Linux, and LabVIEW Real Time. All instruments are also supported by Software Development Kits which provide API’s for C/C++, C#, and LabVIEW.
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Ground Grid Systems
The Ground Grid systems module enables engineers to quickly and accurately design and analyze ground protection. Flexible design methodologies allow for quick auto-designed layouts or very detailed schemes. Color-coded graphical plots provide impressive results.
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Three-Phase Relay Test Equipment
AK-6
*5 automatic or manual test modules: DC test, AC test, distance test, harmonics and frequency protection*Phase, frequency and amplitude are continuously and independently adjustable.*All-in-one design: built-in Windows CE & rotary encoder & keyboard & 6.4" TFT LCD (RJ45/USB for updates and downloads)*High power: 3x450VA at 0...35A average voltage test
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STDF Test Data Analysis Tool
DataView
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Tire Pressure System
Hangzhou Pulani Electronic Co.,Ltd
A Tyre Pressure Monitoring System (TPMS) tpms for motorcycles is an efficient and effective solution to many current automotive safety issues. TPMS will help minimize driving risks and reduce fuel consumption.
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Video-Endoscope Systems
Documentation Unit + High Power Light Source + probe incl. Control and lens The modular systems can be combined and endlessly expandable.
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Optics Test Equipment + Flatness, Bow, Warp, Curvature, Glass Thickness
Wedge Angle Scanner For Car Windshields
Optik Elektronik Gerätetechnik GmbH
Scanning of complete car windshields for measurement of wedge angle and thickness distribution, in particular in the HUD area.
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Test Fixtures
At A.T.E Solutions we have a dealt with a wide range of test subjects in the past 30 years and have extensive experience in providing reliable test fixture solutions.
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Partial Discharge Expert Diagnostic and Location System
PDExpert
Power Monitoring and Diagnostic Technology Ltd.
The PDExpert is PMDT's third level of Partial Discharge (PD) Expert Diagnostic and Location System. It is a powerful, portable, multi-channel system of impeccable design used to analyze and pinpoint PD signals coming from a power asset within centimeters while the power system is energized. The system consists of UHF, AE, HFCT and ultrasonic sensors, one advanced UHF/PD signal processing unit, one oscilloscope, filters and other accessories.The system employs ultra-high speed data acquisition an...show more -
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Robust RISC-based DIN-rail Fanless Embedded System With I.MX 6UL Processor, COM, LAN, DIO 2-in/2-out (Source Type) And 2 PCIe Mini Card Slots
IRU131-SO
*RISC-based (i.MX 6UltraLite) processor 528 MHz*512MB DDR3 SDRAM onboard*8GB eMMC flash onboard*2 PCI Express Mini Card slots (Wi-Fi, 3G/4G or LoRa)*1 isolated COM port*1 isolated DIO 2-in/2-out (source type)*Power input range of 9V to 48V DC with terminal block*Embedded Linux operating system (Yocto)*Wide operating temperature range from -40°C to +70°C*Supports OPC UA
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DC System Earth Fault Detector
PDF1000 / 781
Wuhan Huatian Electric Power Automation Co., Ltd.
Our company's DC system grounging fault tester is a new generation of products. It can be applied to dc system measurement of any voltage level.
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Alligator Test Clips
Alligator clips are spring loaded clips that are used to temporarily connect wires to components on circuit boards, connector pins, or other terminals.
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System to Handle Wafer Levels
AMI AW Series
Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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CAM/TRAC Test Kits
Series 471
The Series 471 CT-VP103S dual well mechanical kits provide a test solution where Z axis, the testing of two PCA’s, and Virginia Panel ITA G12 interface compatibility are required. These can be similar devices, or devices that are used together in a functional test. The Series 471 Kits have the same available features and options as the Series 47 Kits. (Limited sizes available.)
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Turret Drive Stabilization System
Curtiss-Wright Defense Solutions
Weapons' accuracy and reliability are crucial factors for combat success. The ability to accurately locate a target and stabilize the shot while moving out of the line of sight could make all the difference.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Current Transformer Test Set
Vanguard Instruments Company, Inc.
The EZCT-2000C is Vanguard’s third-generation microprocessor-based current transformer test set. Designed specifically for CT testing, the EZCT-2000C has the following outstanding features that can greatly increase productivity and save time during the commissioning stage:
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Stationary Meter Test Stations
Astel
Calmet Smart Calibration Devices
Multi position single and three phase series meter test stations class up to 0.01% for simultaneous and automatic calibration and legalization of 32/64 electricity meters
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UV Test Chamber
Wewon Environmental Chambers Co, Ltd.
* UV test chamber simulates damaging effects of long term outdoor exposure of materials and coatings by exposing test samples to varying conditions of the most aggressive components of weathering – ultraviolet radiation, moisture and heat. * UV test chamber use fluorescent lamps to provide a radiation spectrum centered in the ultraviolet wavelengths. Moisture is provided by forced condensation, and temperature is controlled by heaters. Based on your testing sample’s size, We has two options uv test chambers for choice.
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HDT & Vicat Systems
The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
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Fanless Embedded System With LGA1151 Socket 7th/6th Gen Intel® Core™ I7/i5/i3 & Celeron® Processor, Intel® H110, 2 HDMI, DisplayPort, 4 GbE LAN, 6 USB, PCIe X4/PCI Slot And 9 To 36 VDC
eBOX700-891-FL
The eBOX700-891-FL is an expansion-rich fanless embedded system powered by the 7th generation Intel® Core™ i7/i5/i3 and Celeron® processors (codename: Kaby Lake) with the Intel® H110 chipset. It supports dual DDR4-2133 SO-DIMM slots with up to 32GB system memory. This embedded box PC comes with a user-friendly mechanism design and offers great flexibility, reliability, and scalability, well suited for vision inspection (USB/PoE), motion control, security surveillance and industrial automation. T...show more -
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Fanless Embedded System With Socket G2 Intel® Core™ I7/i5/i3 & Celeron® Processor And 4 GbE LANs
eBOX660-872-FL
A high-performance fanless embedded system with 3rd Generation Intel® Core™ processor (Ivy Bridge), the eBOX660-872-FL, is presented by Axiomtek earnestly. It incorporates the 3rd Generation Intel® Core™ processor (i7/ i5/ i3) or Intel® Celeron® processor with Intel® HM76 Express chipset, propelling computing with better processing. With the great graphics computing capability and dual view support, this fanless embedded box computer is especially suited for automatic optical inspection, digital...show more -
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
